41. APLMF（亚太法制计量论坛） Objectives, events, news and meetings of fourteen member economies. Contacts for the secretariat in Tsukuba, Japan. http://www.aplmf.org/

The Asia-Pacific Legal Metrology Forum The Asia-Pacific Legal Metrology Forum (APLMF) is a grouping of legal metrology authorities in the Asia Pacific Economic Cooperation (APEC) economies and other economies on the Pacific Rim, whose objective is the development of legal metrology and the promotion of free and open trade in the region through the harmonization and removal of technical or administrative barriers to trade in the field of legal metrology. workshop on software controlled measuring instruments The APEC/APLMF workshop on software controlled measuring instruments is scheduled to be held in Bangkok Thailand on August 3-6. Training Course on mass flow meter The APEC/APLMF training course on mass flow meterwill be held in Singapore on July 6-9. Training Course on NAWI The APEC/APLMF Training the Trainer course on High Capacity Non-Automatic Weighing Instrument (NAWI) will be held in Bandung, Indonesia on June 7-10. Click more to find details. 17th APLMF Forum Meeting Please click here APLMF 17th Meeting Documents APLMF Guidlines 17th APLMF Forum Meeting ... News of APLMF in September The 17th APLMF Forum Meeting and Related Working Group Meeting will be held in the week of September 13-17, 2010 in Victoria, British Columbia, Canada.

42. Metrology - Definition Of Metrology By The Free Online Dictionary, Thesaurus And me trol o gy (mtr l-j) n. pl. me trol o gies. 1. The science that deals with measurement. 2. A system of measurement. French m trologie, from Greek metrologi, theory of ratios http://www.thefreedictionary.com/metrology

43. Default Exports instruments for use in control and in workshops for mechanical industries, aeronautics, cars. Location in Southern France. http://www.european-metrology.com/

44. Helsinki University Of Technology Metrology Research Institute Research includes electrical instrumentation, optical radiation measurements, fiber optics and quantum optics. http://metrology.tkk.fi/

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45. KLA Tencor | Metrology Solutions And Tools metrology is a critical discipline in the production of high performance, reliable devices. http://www.kla-tencor.com/metrology.html

HOME COMPANY PRODUCTS NEWS/EVENTS ... LANGUAGE Chip Manufacturing Metrology Chip Manufacturing Front-End Defect Inspection Back-End Defect Inspection Defect Review ... A to Z Product Glossary Metrology addthis_language = "en"; addthis_header_color = "#FFFFFF"; addthis_header_background = "#000000"; Metrology is a critical discipline in the production of high performance, reliable devices. Whether verifying that a design will be manufacturable, characterizing a new process, or monitoring high-volume manufacturing processes, our comprehensive set of metrology, analysis and process window optimization products gives IC manufacturers the ability to maintain tight control of their processes. Overlay Archer Series : Overlay registration metrology systems Optical CD AcuShape : Modeling and library-generation package for optical CD systems SpectraCD : Optical critical-dimension (CD) and profile metrology systems Film Thickness / Index Aleris Family : Film thickness, refractive index (RI), stress and composition metrology systems for leading-edge applications ASET-F5x : Film thickness, refractive index (RI) and stress metrology system for the 90nm and higher design nodes

46. AIST:Metrology And Measurement Science AIST develops national standards of the highest accuracy and supplies these standards to users. Includes details of research activities. In English and Japanese. http://www.aist.go.jp/aist_e/aist_laboratories/6metrology/

JAPANESE Site Map Full Text Search AIST HOME Research results Latest Researches ... Geological Survey and Applied Geoscience Metrology and Measurement Science AIST Fellow Research Coordinator Mitsuru Tanaka It is necessary to establish the dissemination system of basic metrology standards in Japan with the same condition as other advanced nations in Europe and North America. Therefore, the development of metrology standards in AIST and the establishment of a global mutual recognition among countries were required. AIST also makes recommendations and supports the utilization of metrology standards as basic tools when the Japanese government implements policies on such areas as industrial technology and standards accreditation. Nanometer-scale dimensional standard calibrated by metrological atomic force microscope (AFM) equipped with length-unit-traceable laser interferometers Development of future metrology standards and taking initiative in contributing to the establishment of new international standards and strengthening of international competitiveness AIST is actively involved in technical development of future metrology standards and also envisions future revisions in the definitions of fundamental units. As a result, AIST is expected to contribute to strengthening industrial competitiveness by acquiring superiority in new international standards and by feeding back to the development of industry in the field of advanced measurement technologies.

47. SEMATECH Research: Metrology metrology. metrology—the exacting science of measurement for process control—is crucial to the advancement of semiconductor manufacturing. Accordingly, metrology faces some http://www.sematech.org/research/metrology/index.htm

Home ISMI Login to Member Site Contact Us ... History Metrology Advanced Metrology A project with Oregon-based FEI Company to develop a transmission electron microscope (TEM) utilizing electron energy loss spectroscopy (EELS) with focused ion beam (FIB) for measuring defects in semiconductor devices. TEM-EELS-FIB is the leading candidate to replace the current technology, scanning electron microscopy (SEM) with energy-dispersive X-ray, for analyzing defects at 45 nm or below. An effort with Veeco Instruments of Plainview, NY to compile a reference metrology system for critical dimension (CD), depth, overlay, and 3D applications at the 45 nm, 32 nm, and (where possible) 22 nm technology generations. A joint-development agreement with Xidex, an Austin, Texas company, to develop carbon nanotube-tipped cantilevers for atomic force microscopes, to allow high resolution mapping of dopant profiles, work function variation, and dielectric damage. Manufacturing-focused Metrology International SEMATECH Manufacturing Initiative (ISMI) focuses on tool and technology evaluations and overall factory integration with the goal of establishing a world-class industry collaborative program of metrology for advanced manufacturing. Specific areas of focus include: Defect metrology - seeks to develop defect standards and assess limits and extendibility of tools for patterned and unpatterned wafer inspection, bevel edge inspection, and defect review and characterization. This program works with suppliers to develop solutions for manufacturing deployment of tools and systems.

48. Welcome: Surface Metrology Research Group: Computing And Engineering: University The main areas of research at the Centre for Precision Technologies are surface measurement and nano-metrology, surface instruments and surface characterisation. http://www2.hud.ac.uk/ce/research/smg/

Information about: Studying here Courses News and events Job vacancies ... Search Information for: Students Researchers Former students Staff You are here: Uni home page Computing and Engineering Research Research groups ... Introduction Surface Metrology Research Group Welcome The Centre for Precision Technologies (CPT) activities are focussed on research in the field of precision engineering. Within the CPT, research is split into three sub-groups: the Advanced Machine Technology Group, the Engineering Control and Machine Tool Performance Group, and the Surface Metrology Research Group. The Centre for Precision Technologies (CPT) at the University, with its three specialist research groups, now houses some 30 scientists and carries out research on behalf of major multi-national companies. With an excellent track record of working with industry, our Chair in Surface Metrology is sponsored by the world leading metrology instrument manufacturer Taylor Hobson and is currently held by Professor Liam Blunt, Director of CPT. Most recently the University and National Physical Laboratory Ltd (NPL) signed a Memorandum of Understanding, which will provide a framework for collaborative research and business collaboration in the field of engineering measurement in support of the UK manufacturing industry.

49. Metrology | Define Metrology At Dictionary.com –noun, plural gies. the science of weights and measures. Use metrology in a Sentence See images of metrology Search metrology on the Web Origin 1810–20; metro- 1 + -logy http://dictionary.reference.com/browse/metrology

50. NRLM NRLM consists of four research departments, addressing quantum, thermophysical, mechanical metrology and measurement system, located in Tsukuba, Japan. http://www.aist.go.jp/NRLM/english/

51. SURVICE Metrology SURVICE metrology provides innovative and integrated dimensional metrology, 3D modeling, and metrology application development services. From our metrology center in http://metrology.survice.com/facilities.asp

52. DFM - Dansk Fundamental Metrologi Primarily supporting national industry with metrological knowledge and calibrations with international recognition. Includes priced services in electrolytic conductivity, optical power and wavelength, surface topography. Course in precision and nanometrology, and news about nanotechnology. http://www.dfm.dtu.dk/

Matematiktorvet 307 DK-2800 Kgs. Lyngby Tel. +45 4593 1144 Kalibrering Masse J�vnsp�nding Resistans ... BedreInnovation Dansk Fundamental Metrologi A/S DTU DFM er en godkendt teknologisk service ( GTS DFM koordinerer den decentrale metrologiske struktur i Danmark gennem organisationen DANIAmet Innovationstjek Har du lyst til at f� helt nye �jne p� din virksomheds innovative muligheder og behov? Bestil et gratis innovationstjek, og vi kommer forbi med nye �jne og friske id�er. Kursus i AFM og Nanometrologi DFM holder kursus i 'Introduktion til AFM og Nanometrologi' tirsdag 24. november, 2010. M�der og konferencer Forsknings- og Innovationsstyrelsen afholder debatkonferencen "Made in Denmark?" den 11. november 2010 omkring fastholdelse af produktion og udvikling i Danmark Softwarevalidering DFM holder kursus i validering af software til laboratoriebrug 9-10 november 2010.

53. 3D Scanning, Reverse Engineering, Measurement Services And Equipment Exact metrology offers the complete range of portable metrology equipment solutions and contract measurement services for 3D scanning, reverse engineering, and more. http://www.exactmetrology.com/

Home Contact Support Quote Exact Metrology offers a complete line of portable scanning and measurement technologies as well as contract measurement services for 3D scanning, reverse engineering, non-contact inspection, 3D digitizing and training. From short-range to large-scale; white light to laser; contact to non-contact; and engineering to inspection; Exact Metrology has the tools, talents and expertise to get your job done right. For services, rentals or purchases, choose from ROMER, Leica Geosystems, Breuckmann, Artec, Metronor, NDI, Surphaser, InnovMetric and other leading companies. 3D measurement for design, engineering, manufacturing, analysis and inspection. Laser, white light, CT Scanners, portable CMMs, trackers Short and long range On-site and remote Long range scanning for large-scale metrology. Click here to see more. September 2010 You are cordially invited to come see Exact Metrology demonstrate the latest 3D scanning and measurement technologies at the first Iowa Portable Metrology Expo. Click here for more information.

54. OIML - International Organization Of Legal Metrology Established to promote the global harmonization of legal metrology procedures. Includes overview of certificate system, publications for purchase, meetings, participating regional and internal organizations, member login, contacts in Paris, France. http://www.oiml.org

55. Metrology Services - ATT Metrology Services [888.320.7011] metrology Services industrial measurement specialists using 3D equipment/software, manufacturer of targets hardware, uses photogrammetry, laser scanners, laser tracker systems. http://www.attinc.com/

You need to upgrade your Flash Player! Please click here! You need to upgrade your Flash Player! Please click here! Fabrication/Assembly Training ... Site Map ATT METROLOGY MEASUREMENT SERVICES You need to upgrade your Flash Player! Go here. Equipment and services available 24 hours a day, 7 days a week, 365 days a year, anywhere, anytime, no job too big or too small. We excel at exceeding customers' expectations. Call 888-320-7011 or e-mail today so we can show how we can help with your project. Order TARGET ADAPTERS HERE ATT Metrology Services also designs and manufactures a line of unsurpassed Laser Tracker Targets for our precision measurement systems. These Laser Tracker Targets are made of heat-treated stainless steel, which makes them exceptionally durable even in the harshest of environments, while providing the functionality that allows efficient and accurate measurements. If you have any questions, need a custom size, or would like a free sample provided for your evaluation, please contact us.

56. Rudolph : Metrology Rudolph provides fullfab solutions with its ellipsometry and PULSE Technology™ tools for thin-film measurements that are used in all stages of semiconductor manufacturing http://www.rudolphtech.com/Metrology.aspx

Contact Us Locations Careers Home ... Wafer Saw Metrology Systems for Advanced Processes Windows/OS/2 Upgrade Now! Program MetaPULSE System Opaque Film Metrology The industry’s first production-worthy opaque film metrology tool MetaPULSE-G System Opaque Film Metrology Delivers superior performance on Cu films that are critical in advanced device technologies and new TSV processes MetaPULSE-III System Opaque Film Metrology The MetaPULSE-III offers superior on-product measurements of ultrathin to thick opaque films MetaPULSE-IIIa System Opaque Film Metrology Achieve high throughput and low cost-of-ownership for film thickness measurements in aluminum applications Refurbished Tool Program Refurbished by Rudolph Choose the quality of a Refurbished by Rudolph tool when considering a used tool S3000 CD System Optical Critical Dimension Metrology Discover the benefits of multi-angle, multi-wavelength laser scatterometry S3000A System Fab-Wide Transparent Metrology Optimized price and performance for non-diffusion film applications S3000S System Fab-Wide Transparent Metrology Offers simultaneous FBE and DUVR measurement in advanced diffusion and fabwide thin film applications Critical Dimensions Opaque Film Metrology Metrology Other Phase-change Random Access Memory ... Site Map

57. French Metrology Network: Studies And Research In Metrology Organization managing the French metrology. Includes information on the organization, its history, the SI, national references, research topics, international activities and publications. In English and French. http://www.french-metrology.com/

All news Probing space-time by combining cold atom clocks, laser pulses and a satellite French metrology researchers to make key contribution to CPEM 2010 The LNE awards its first research prize LNE and KRISS (Korea) sign MoU for cooperation in the chemistry field ... More news A force for progress Working together for a changing world, a key priority for France's metrology network. Organization, teams, projects and perspectives of the French metrology network. Consult our brochure (pdf - 2 Mo) Metrology Events June 13-18, 2010 - KRISS / Daejon Beach - South Korea CPEM 2010 : Conference on Precision Electromagnetic Measurements July 5-6, 2010 - LNE / Paris - France EMRP, Partnering meeting : environment July 7-8, 2010 - LNE / Paris - France EMRP, Partnering meeting : industry All metrology events Special feature : Metrology of the waveform of complex dynamic signals Digital technologies used in telecommunications (WPAN*, WLAN*, WMAN*, WWAN* and DSL* networks, satellites, etc.) and in instrumentation are developing fast. The main trend today in telecommunications is towards systems operating in ever higher bandwidths and using modulated radio frequency signals with a complex waveform. This raises the problem of calibrating the waveform of these complex dynamic signals and ensuring their traceability to the International System of Units (SI). A number of different instruments are needed to generate, obtain and process the signals: modulated radio frequency sources, random waveform generators, broadband digital oscilloscopes, spectrum analysers, non-linear vectorial network analysers, etc.

58. Michigan Metrology Michigan metrology offers highspeed measurement services, 3D surface inspection and wear analysis for drivetrain, engines, materials, polymers, metals, paper, printing http://www.michmet.com/

Home About Benefits Certification ... Contact Call toll free, info@michmet.com Quantitative answers in 1 week or less. Personal attention. Expert analysis. Call toll free, info@michmet.com Since 1994 Michigan Metrology has been providing high-volume inspection services and solving problems related to surface roughness, wear, texture, finish, flatness and more. Using advanced 3D surface roughness measurement and analysis techniques, state-of-the-art equipment and expert understanding of 3D surface metrology we have helped thousands of clients. A sample 3D surface roughness measurement of a plastics substrate. Leaks Squeaks Friction Wear ... Vibration Purchase orders, Visa, MasterCard and American Express welcomed. 17199 N. Laurel Park Dr #51 Livonia, MI 48152 Phone 734-953-5030 Fax 734-953-5611 info@michmet.com

59. KLA-Tencor-Prometrix | Service | Sales | Parts | Refurbished Systems -- Metrolog metrology Equipment sales and service including Refurbished systems, Spare Parts, Consumables, OnSite Field Engineering, and In-House Repair/Calibration Services for KLA http://metrologyequipmentservices.com/

M etrology E quipment S ervices, LLC - Metrology Equipment sales and service including Refurbished systems, Spare Parts, Consumables, On-Site Field Engineering, and In-House Repair/Calibration Services for KLA-Tencor-Prometrix advanced semiconductor measuring systems. For more than 10 years, MES has provided products and services to the semiconductor, aerospace and medical industries. Our team is dedicated to discovering, developing and implementing the right solutions for your university or company. Specialized Service for SurfScan Systems Refurbished Equipment We buy and sell high quality refurbished wafer measurement tools. All our refurbished systems come with a parts and labor warranty. For customers located in the Bay Area, installation is included with the purchase. If shipment is needed, we provide free crating for select systems. We currently have AS-200s and P-1/P-2 profilers available for leasing. Please contact us for a quote. We stocks hundreds of spare parts for many metrology systems. Our inventory includes Consumables, OEM and certified refurbished parts which conform to the manufacture's specs. Our listings have been divided into several systems categories:

60. INSITUTEC INC. - PRECISION METROLOGY, NANO MOTION, CHEMICAL AND BIOLOGICAL, Insi Nanotechnology company providing macro-metrology products for measuring large scale parts with micro to nanometer accuracies and micro-metrology products with sensors based on standing wave technology. http://www.insitutec.com

home customer service Precision Metrology Achieve 3D measurements that you thought were impossible. See how our tools and services will give you precision quality parts. Nano Motion Push the boundaries of your process with true nano-motion. Learn how nano-motion devices can accelerate your processes. Chemical and Biological Manipulate biological samples at unprecedented speeds. Learn how our discovery will give your field a competitive edge. US Office 45 Odell School Rd. Suite A Concord, NC 28027 Tel: 704-782-0593 Fax: 704-782-0597

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